Browsing by Author "Jain, Mahavir Rajmal"

Now showing items 1-1 of 1

    • Built-in self test architecture for mixed signal systems 

      Jain, Mahavir Rajmal (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
      Built-in self test architecture or BIST as we call them, are the necessity of time since the shrinking sizes of component on-chip with advance in IC technology are making it BIST artistries are being rapidly developed and ...