Browsing by Subject "Automatic test equipment"

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    • Built-in self test architecture for mixed signal systems 

      Jain, Mahavir Rajmal (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
      Built-in self test architecture or BIST as we call them, are the necessity of time since the shrinking sizes of component on-chip with advance in IC technology are making it BIST artistries are being rapidly developed and ...