Browsing by Subject "Built in self test"

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    • Low power BIST architecture for fast multiplier embedded core 

      Vij, Aditya (Dhirubhai Ambani Institute of Information and Communication Technology, 2006)
      A typical core is deeply embedded in the chip of a system so that direct access to its input/output is not possible. Built in self test (BIST) structures are excellent solutions for testing embedded cores. In this work, ...