Browsing by Subject "Fault tolerance"
Now showing items 1-2 of 2
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Column decoder for memory redundant cell array
(Dhirubhai Ambani Institute of Information and Communication Technology, 2010)As the semiconductor technology advances, the yield of memory chip is reducing. The cause of yield degradation is errors in manufacturing process associated with tight geometries. The thesis work proposes a redundancy ... -
Realization of FPGA based digital controller
(Dhirubhai Ambani Institute of Information and Communication Technology, 2010)Field Programmable Gate Array (FPGA) can be used to enhance the efficiency and the flexibility of digital controller. FPGA implementation of digital controllers leads to real time realizations with small size and high ...