Browsing by Subject "Very Large Scale Integrated"

Now showing items 1-3 of 3

    • Built-in self-test for a flash analog to digital converter 

      Bhalerao, Mangesh (Dhirubhai Ambani Institute of Information and Communication Technology, 2006)
      The intricacies of modern System on Chips (SoCs), comprising of analog, digital and even Redio-Frequency (RF) blocks on a single chip, are surpassing all previous conceivable limits. A more perplexing problem now is not ...

    • Low power BIST architecture for fast multiplier embedded core 

      Vij, Aditya (Dhirubhai Ambani Institute of Information and Communication Technology, 2006)
      A typical core is deeply embedded in the chip of a system so that direct access to its input/output is not possible. Built in self test (BIST) structures are excellent solutions for testing embedded cores. In this work, ...

    • Statistical delay modeling and analysis for system on chip 

      Patel, Jay (Dhirubhai Ambani Institute of Information and Communication Technology, 2006)
      It is seen that designing using conventional methodologies in Deep Sub Micron geometries, at times, ends up in very pessimistic design and less yield. This is because, today’s tools don’t consider statistical variation of ...