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Column decoder for memory redundant cell array
(Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
As the semiconductor technology advances, the yield of memory chip is reducing. The cause of yield degradation is errors in manufacturing process associated with tight geometries. The thesis work proposes a redundancy ...
Design of the high speed, high accuracy and low power current comparators
(Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
Comparators are non linear, decision making analog circuits, which find wide spread application in data converters, data transmission and others. Comparison can be done in terms of “Voltage” or “Current”.
A current ...