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Statistical co-analysis, robust optimization and diagnosis of USB 2.0 system for signal and power integrity
(Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
Signal Integrity (SI) and Power Integrity (PI) are the most critical issues as semiconductor industry is moving towards higher operational speeds. Signal integrity and power integrity are such issues that should be looked ...
New learning based super resolution using contourlet transform
(Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
new learning based super-resolution reconstruction using contourlet transforms is proposed. contourlet transform provides high degree of directionality. It captures geometrical smoothness along multiple directions and ...