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Column decoder for memory redundant cell array
(Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
As the semiconductor technology advances, the yield of memory chip is reducing. The cause of yield degradation is errors in manufacturing process associated with tight geometries. The thesis work proposes a redundancy ...
Low power SRAM design
(Dhirubhai Ambani Institute of Information and Communication Technology, 2008)
In the past, power dissipation was not constraining factor because of device density and operating frequency was low enough. But nowadays due to increased integration and operating frequency of integrated circuits, power ...