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Column decoder for memory redundant cell array
(Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
As the semiconductor technology advances, the yield of memory chip is reducing. The cause of yield degradation is errors in manufacturing process associated with tight geometries. The thesis work proposes a redundancy ...
High speed sample and hold circuit design
(Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
Sampling of the time-varying input signal is the first step in any type of Analog to Digital (A/D) conversion. For Low Power and high-speed A/D converter, a high-performance Sample and Hold (S/H) circuit is needed as its ...