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Statistical co-analysis, robust optimization and diagnosis of USB 2.0 system for signal and power integrity
(Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
Signal Integrity (SI) and Power Integrity (PI) are the most critical issues as semiconductor industry is moving towards higher operational speeds. Signal integrity and power integrity are such issues that should be looked ...
Built-in self test architecture for mixed signal systems
(Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
Built-in self test architecture or BIST as we call them, are the necessity of time since the shrinking sizes of component on-chip with advance in IC technology are making it BIST artistries are being rapidly developed and ...