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    Author
    Jain, Mahavir Rajmal (1)
    SubjectAutomatic test equipment (1)Design and construction (1)Digital techniques (1)
    Integrated circuits (1)
    lectronic circuit design (1)Metal oxide semiconductors (1)Mixed signal circuits (1)Signal generators (1)Signal processing (1)Testing (1)... View MoreDate Issued2009 (1)Has File(s)Yes (1)

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    Built-in self test architecture for mixed signal systems 

    Jain, Mahavir Rajmal (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
    Built-in self test architecture or BIST as we call them, are the necessity of time since the shrinking sizes of component on-chip with advance in IC technology are making it BIST artistries are being rapidly developed and ...

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