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    AuthorJain, Mahavir Rajmal (1)Lad, Umeshkumar Mangubhai (1)SubjectDesign and construction (2)
    Integrated circuits (2)
    Verification (2)
    Automatic test equipment (1)Digital techniques (1)Electronic circuit design (1)lectronic circuit design (1)Metal oxide semiconductors (1)Mixed signal circuits (1)Signal generators (1)... View MoreDate Issued
    2009 (2)
    Has File(s)Yes (2)

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    Built-in self test architecture for mixed signal systems 

    Jain, Mahavir Rajmal (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
    Built-in self test architecture or BIST as we call them, are the necessity of time since the shrinking sizes of component on-chip with advance in IC technology are making it BIST artistries are being rapidly developed and ...
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    Transaction based verification of DA-FIR filter using AMBA AHBTm transactor 

    Lad, Umeshkumar Mangubhai (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
    Transaction based verification is used for faster verification purpose. Reusable transactors are designed and designs are verified at transaction level using these transactors. The test bench are written in higher level ...

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