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    AuthorJain, Mahavir Rajmal (1)Patel, Birenkumar (1)Subject
    Integrated circuits (2)
    Testing (2)
    Verification (2)
    Automatic test equipment (1)Computer software (1)Design and construction (1)Digital electronics (1)Digital techniques (1)Electronic apparatus and appliances (1)Electronic circuits (1)... View MoreDate Issued2009 (1)2010 (1)Has File(s)Yes (2)

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    Built-in self test architecture for mixed signal systems 

    Jain, Mahavir Rajmal (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
    Built-in self test architecture or BIST as we call them, are the necessity of time since the shrinking sizes of component on-chip with advance in IC technology are making it BIST artistries are being rapidly developed and ...
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    Transaction based verification of discrete wavelet transform IP core using wishbone transactor 

    Patel, Birenkumar (Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
    Verification is major concern in product development life cycle. The number of human hours required writing a test bench and choice of verification approach is the major contributor in the Non Recurring Engineering (NRE) ...

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