Now showing items 1-5 of 5

    • Built-in self test architecture for mixed signal systems 

      Jain, Mahavir Rajmal (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
      Built-in self test architecture or BIST as we call them, are the necessity of time since the shrinking sizes of component on-chip with advance in IC technology are making it BIST artistries are being rapidly developed and ...
    • Design & layout of a low voltage folding & interpolation ADC for high speed applications 

      Tiwari, Sandeep Kumar (Dhirubhai Ambani Institute of Information and Communication Technology, 2012)
      Analog to Digital Converters (ADC) and Digital to Analog Converters (DAC) plays a vital role in mixed analog signalling, communication and digital signal processing world. Now a day, the demand for designing of high ...
    • High speed sample and hold circuit design 

      Dwivedi, Varun Kumar (Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
      Sampling of the time-varying input signal is the first step in any type of Analog to Digital (A/D) conversion. For Low Power and high-speed A/D converter, a high-performance Sample and Hold (S/H) circuit is needed as its ...
    • Statistical co-analysis, robust optimization and diagnosis of USB 2.0 system for signal and power integrity 

      Tripathi, Jai Narayan (Dhirubhai Ambani Institute of Information and Communication Technology, 2009)
      Signal Integrity (SI) and Power Integrity (PI) are the most critical issues as semiconductor industry is moving towards higher operational speeds. Signal integrity and power integrity are such issues that should be looked ...
    • Test methodology for prediction of analog performance parameters 

      Akula, Sandeep (Dhirubhai Ambani Institute of Information and Communication Technology, 2010)
      Analog testing, the name itself signifies the detection of faults in analog circuits. The aim of this thesis is to increase the test effectiveness and work in the performance parameter space. There are many test methodologies ...